Authors:
HU YZ
TAY SP
WASSERMAN Y
ZHAO CY
HEBERT KJ
IRENE EA
Citation: Yz. Hu et al., CHARACTERIZATION OF ULTRATHIN SIO2-FILMS GROWN BY RAPID THERMAL-OXIDATION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 1394-1398
Citation: Kj. Hebert et Ea. Irene, FOWLER-NORDHEIM TUNNELING CURRENT OSCILLATIONS AT METAL OXIDE/SI INTERFACES/, Journal of applied physics, 82(1), 1997, pp. 291-296
Authors:
HEBERT KJ
ZAFAR S
IRENE EA
KUEHN R
MCCARTHY TE
DEMIRLIOGLU EK
Citation: Kj. Hebert et al., MEASUREMENT OF THE REFRACTIVE-INDEX OF THIN SIO2-FILMS USING TUNNELING CURRENT OSCILLATIONS AND ELLIPSOMETRY, Applied physics letters, 68(2), 1996, pp. 266-268