Citation: Rma. Heeren et K. Vekey, A NOVEL METHOD TO DETERMINE COLLISIONAL ENERGY-TRANSFER EFFICIENCY BYFOURIER-TRANSFORM ION-CYCLOTRON RESONANCE MASS-SPECTROMETRY, Rapid communications in mass spectrometry, 12(17), 1998, pp. 1175-1181
Authors:
VANROOIJ GJ
DUURSMA MC
DEKOSTER CG
HEEREN RMA
BOON JJ
SCHUYL PJW
VANDERHAGE ERE
Citation: Gj. Vanrooij et al., DETERMINATION OF BLOCK LENGTH DISTRIBUTIONS OF POLY(OXYPROPYLENE) ANDPOLY(OXYETHYLENE) BLOCK-COPOLYMERS BY MALDI-FTICR MASS-SPECTROMETRY, Analytical chemistry, 70(5), 1998, pp. 843-850
Authors:
VANDERHAGE ERE
DUURSMA MC
HEEREN RMA
BOON JJ
NIELEN MWF
WEBER AJM
DEKOSTER CG
DEVRIES NK
Citation: Ere. Vanderhage et al., STRUCTURAL-ANALYSIS OF POLYOXYALKYLENEAMINES BY MATRIX-ASSISTED LASERDESORPTION IONIZATION ON AN EXTERNAL ION-SOURCE FT-ICR-MS AND NMR/, Macromolecules, 30(15), 1997, pp. 4302-4309
Citation: Gj. Vanrooij et al., HIGH-RESOLUTION END GROUP DETERMINATION OF LOW-MOLECULAR-WEIGHT POLYMERS BY MATRIX-ASSISTED LASER-DESORPTION IONIZATION ON AN EXTERNAL ION-SOURCE FOURIER-TRANSFORM ION-CYCLOTRON RESONANCE MASS-SPECTROMETER, Journal of the American Society for Mass Spectrometry, 7(5), 1996, pp. 449-457
Citation: Rma. Heeren et Jj. Boon, RAPID MICROSCALE ANALYSES WITH AN EXTERNAL ION-SOURCE FOURIER-TRANSFORM ION-CYCLOTRON RESONANCE MASS-SPECTROMETER, International journal of mass spectrometry and ion processes, 158, 1996, pp. 391-403
Citation: Cg. Dekoster et al., ENDGROUP ANALYSIS OF POLYETHYLENE-GLYCOL POLYMERS BY MATRIX-ASSISTED LASER-DESORPTION IONIZATION FOURIER-TRANSFORM ION-CYCLOTRON RESONANCE MASS-SPECTROMETRY, Rapid communications in mass spectrometry, 9(10), 1995, pp. 957-962
Citation: Rma. Heeren et al., DIRECT TEMPERATURE RESOLVED HRMS OF FIRE-RETARDED POLYMERS BY IN-SOURCE PYMS ON AN EXTERNAL ION-SOURCE FOURIER-TRANSFORM ION-CYCLOTRON RESONANCE MASS-SPECTROMETER, Analytical chemistry, 67(21), 1995, pp. 3965-3970
Authors:
HEEREN RMA
DEGRAAF MJ
CIRIC D
HOPMAN HJ
KLEYN AW
Citation: Rma. Heeren et al., ANGULAR AND ENERGY-DISTRIBUTIONS OF SURFACE PRODUCED H- AND D- IONS IN A BARIUM SURFACE CONVERSION SOURCE, Journal of applied physics, 75(9), 1994, pp. 4340-4351
Authors:
HEEREN RMA
MEYLER DB
CIRIC D
HOPMAN HJ
KLEYN AW
Citation: Rma. Heeren et al., HYDROGEN AND DEUTERIUM DEPTH PROFILES IN A BARIUM SURFACE CONVERTER DETERMINED BY LAMS AND P-SNMS, Applied surface science, 68(2), 1993, pp. 265-274