Authors: HEUELL P CUZDI S KULAKOV MA BULLEMER B

Citation: P. Heuell et al., AN ULTRA-HIGH-RESOLUTION CONTROL UNIT FOR A SCANNING TUNNELING MICROSCOPE, Thin solid films, 264(2), 1995, pp. 217-222

Authors: TEUFEL L HEUELL P KULAKOV MA BULLEMER B

Citation: L. Teufel et al., SCANNING-TUNNELING-MICROSCOPY ON QUENCHED SI(111) SURFACES, Thin solid films, 264(2), 1995, pp. 236-239

Authors: HEUELL P KULAKOV MA BULLEMER B

Citation: P. Heuell et al., STEPPED MORPHOLOGY ON 4H AND 15R SILICON-CARBIDE - MODELING BY A RANDOM-WALK, Surface science, 333, 1995, pp. 965-970

Authors: KULAKOV MA HEUELL P TSVETKOV VF BULLEMER B

Citation: Ma. Kulakov et al., SCANNING-TUNNELING-MICROSCOPY ON THE 6H SIC(0001) SURFACE, Surface science, 315(3), 1994, pp. 248-254

Authors: HEUELL P KULAKOV MA BULLEMER B

Citation: P. Heuell et al., AN ADAPTIVE SCAN GENERATOR FOR A SCANNING TUNNELING MICROSCOPE, Review of scientific instruments, 65(1), 1994, pp. 89-92

Authors: KULAKOV MA WERDIN S HEUELL P BULLEMER B

Citation: Ma. Kulakov et al., MODELING OF PATTERN GROWTH BY VACANCY DIFFUSION AND TRAPPING ON SI(111)7 X 7 SURFACE, Surface science, 287, 1993, pp. 241-244