Authors:
HEYRAUD JC
BERMOND JM
ALFONSO C
METOIS JJ
Citation: Jc. Heyraud et al., A REFLECTION ELECTRON-MICROSCOPY INVESTIGATION OF THE DIVERGENCE OF THE MEAN CORRELATED DIFFERENCE OF STEP DISPLACEMENTS ON A SI(III) VICINAL SURFACE, Journal de physique. I, 5(4), 1995, pp. 443-449
Authors:
BERMOND JM
METOIS JJ
HEYRAUD JC
ALFONSO C
Citation: Jm. Bermond et al., REFLECTION ELECTRON-MICROSCOPY STUDIES OF THE STEP MEANDERING AND EVAPORATION ON VICINAL SURFACES OF SILICONE, Surface science, 333, 1995, pp. 855-864