Citation: F. Heyroth et al., X-RAY TOPOGRAPHY OF PERFECT CRYSTALS USING THE LAUE-LAUE 3-BEAM CASE OF DIFFRACTION, Crystal research and technology, 33(4), 1998, pp. 547-554
Authors:
MEDRANO C
HEYROTH F
SCHLENKER M
BARUCHEL J
ESPESO J
Citation: C. Medrano et al., 2-BEAM AND 3-BEAM X-RAY-DIFFRACTION IMAGING OF DOMAINS IN MAGNETITE, Journal of applied crystallography, 31, 1998, pp. 726-732