AAAAAA
Results:
1-7
|
Results: 7
Authors:
HICKERNELL FJ
YUE RX
HICKERNELL FS
Citation: Fj. Hickernell et al., STATISTICAL MODELING FOR THE OPTIMAL DEPOSITION OF SPUTTERED PIEZOELECTRIC FILMS, IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 44(3), 1997, pp. 615-623
Authors:
CARLOTTI G
GUBBIOTTI G
HICKERNELL FS
LIAW HM
SOCINO G
Citation: G. Carlotti et al., COMPARATIVE-STUDY OF THE ELASTIC PROPERTIES OF POLYCRYSTALLINE ALUMINUM NITRIDE FILMS ON SILICON BY BRILLOUIN LIGHT-SCATTERING, Thin solid films, 310(1-2), 1997, pp. 34-38
Authors:
CHUBACHI N
HICKERNELL FS
Citation: N. Chubachi et Fs. Hickernell, THIN-FILMS FOR ACOUSTOELECTRONICS - INTRODUCTION, IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 42(3), 1995, pp. 329-330
Authors:
KIM Y
HUNT WD
HICKERNELL FS
HIGGINS RJ
JEN CK
Citation: Y. Kim et al., ZNO FILMS ON (001)-CUT [110]-PROPAGATING GAAS SUBSTRATES FOR SURFACE-ACOUSTIC-WAVE DEVICE APPLICATIONS, IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 42(3), 1995, pp. 351-361
Authors:
LIAW HM
HICKERNELL FS
Citation: Hm. Liaw et Fs. Hickernell, THE CHARACTERIZATION OF SPUTTERED POLYCRYSTALLINE ALUMINUM NITRIDE ONSILICON BY SURFACE-ACOUSTIC-WAVE MEASUREMENTS, IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 42(3), 1995, pp. 404-409
Authors:
HICKERNELL FS
HICKERNELL TS
Citation: Fs. Hickernell et Ts. Hickernell, SURFACE-ACOUSTIC-WAVE CHARACTERIZATION OF PECVD FILMS ON GALLIUM-ARSENIDE, IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 42(3), 1995, pp. 410-415
Authors:
KIM Y
HUNT WD
HICKERNELL FS
HIGGINS RJ
Citation: Y. Kim et al., SURFACE-ACOUSTIC-WAVE PROPERTIES OF ZNO FILMS ON (001)-CUT (110(-PROPAGATING GAAS SUBSTRATES, Journal of applied physics, 75(11), 1994, pp. 7299-7303
Risultati:
1-7
|