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Authors: BERTNESS KA HICKERNELL RK HAYS SP CHRISTENSEN DH
Citation: Ka. Bertness et al., NOISE-REDUCTION IN OPTICAL IN-SITU MEASUREMENTS FOR MOLECULAR-BEAM EPITAXY BY SUBSTRATE WOBBLE NORMALIZATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1492-1497

Authors: CHRISTENSEN DH HILL JR HICKERNELL RK MATNEY K GOORSKY MS
Citation: Dh. Christensen et al., EVALUATING EPITAXIAL-GROWTH STABILITY, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 113-116

Authors: HICKERNELL RK CHRISTENSEN DH PELLEGRINO JG WANG J LEBURTON JP
Citation: Rk. Hickernell et al., DETERMINATION OF THE COMPLEX REFRACTIVE-INDEX OF INDIVIDUAL QUANTUM-WELLS FROM DISTRIBUTED REFLECTANCE, Journal of applied physics, 75(6), 1994, pp. 3056-3059
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