Authors: THONISSEN M BERGER MG BILLAT S ARENSFISCHER R KRUGER M LUTH H THEISS W HILLBRICH S GROSSE P LERONDEL G FROTSCHER U

Citation: M. Thonissen et al., ANALYSIS OF THE DEPTH HOMOGENEITY OF P-PS BY REFLECTANCE MEASUREMENTS, Thin solid films, 297(1-2), 1997, pp. 92-96