Authors: NEL JM DEMANET CM HILLIE KT AURET FD GAIGHER HL

Citation: Jm. Nel et al., USING SCANNING FORCE MICROSCOPY (SFM) TO INVESTIGATE VARIOUS CLEANINGPROCEDURES OF DIFFERENT TRANSPARENT CONDUCTING OXIDE SUBSTRATES, Applied surface science, 134(1-4), 1998, pp. 22-30

Authors: DEENAPANRAY PNK AURET FD MYBURG G HILLIE KT DEMANET CM

Citation: Pnk. Deenapanray et al., ATOMIC-FORCE MICROSCOPY STUDY OF SI(111) SURFACE-MORPHOLOGY AND ELECTRICAL CHARACTERISTICS OF PD N-SI SCHOTTKY DIODES - EFFECT OF CLEANING PROCEDURES/, Surface and interface analysis, 26(10), 1998, pp. 748-757