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Results: 1-9 |
Results: 9

Authors: AOKI T HIROSHIMA M KITAMURA K TOKUNAGA M YANAGIDA T
Citation: T. Aoki et al., NONCONTACT SCANNING PROBE MICROSCOPY WITH SUB-PICONEWTON FORCE SENSITIVITY, Biophysical journal, 74(2), 1998, pp. 187-187

Authors: HIROSHIMA M AOKI T KITAMURA K TOKUNAGA M YANAGIDA T
Citation: M. Hiroshima et al., LONG-RANGE ATTRACTIVE FORCES BETWEEN HYDROPHOBIC SURFACES USING A MOLECULAR-SIZE PROBE AND A GLASS COVERSLIP DETECTED BY INTERMOLECULAR FORCE MICROSCOPY, Biophysical journal, 74(2), 1998, pp. 187-187

Authors: AOKI T HIROSHIMA M KITAMURA K TOKUNAGA M YANAGIDA T
Citation: T. Aoki et al., NONCONTACT SCANNING PROBE MICROSCOPY WITH SUB-PICONEWTON FORCE SENSITIVITY, Ultramicroscopy, 70(1-2), 1997, pp. 45-55

Authors: AOKI T HIROSHIMA M KITAMURA K TOKUNAGA M YANAGIDA T
Citation: T. Aoki et al., SUB-PICONEWTON INTERMOLECULAR FORCE MICROSCOPY, Biophysical journal, 72(2), 1997, pp. 433-433

Authors: TOKUNAGA M AOKI T HIROSHIMA M KITAMURA K YANAGIDA T
Citation: M. Tokunaga et al., SUBPICONEWTON INTERMOLECULAR FORCE MICROSCOPY, Biochemical and biophysical research communications, 231(3), 1997, pp. 566-569

Authors: ONO K SUZUKI T SAKUTA H ONISAWA K HIROSHIMA M SASAKI T TSUMURA M KONISHI N
Citation: K. Ono et al., A 24 CM DIAGONAL TFT-LCD FABRICATED USING A SIMPLIFIED, 4-PHOTOLITHOGRAPHIC MASK PROCESS, IEICE transactions on electronics, E79C(8), 1996, pp. 1097-1102

Authors: HIROSHIMA M YASAKA T MIYAZAKI S HIROSE M
Citation: M. Hiroshima et al., ELECTRON-TUNNELING THROUGH ULTRATHIN GATE OXIDE FORMED ON HYDROGEN-TERMINATED SI(100) SURFACES, JPN J A P 1, 33(1B), 1994, pp. 395-398

Authors: HIROSE M HIROSHIMA M YASADA T MIYAZAKI S
Citation: M. Hirose et al., CHARACTERIZATION OF SILICON SURFACE MICROROUGHNESS AND TUNNELING TRANSPORT THROUGH ULTRATHIN GATE OXIDE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 1864-1868

Authors: HIROSE M HIROSHIMA M YASAKA T TAKAKURA M MIYAZAKI S
Citation: M. Hirose et al., ULTRA-THIN GATE OXIDE-GROWTH ON HYDROGEN-TERMINATED SILICON SURFACES, Microelectronic engineering, 22(1-4), 1993, pp. 3-10
Risultati: 1-9 |