Authors: HOFF AM

Citation: Am. Hoff, PHYSIOLOGY OF APPEARANCE - ETHICS OF LEVINAS,EMMANUEL, Philosophisches Jahrbuch, 105(1), 1998, pp. 148-161

Authors: HOFF AM ESRY TC NAUKA K

Citation: Am. Hoff et al., MONITORING PLASMA DAMAGE - A REAL-TIME, NONCONTACT APPROACH, Solid state technology, 39(7), 1996, pp. 139

Authors: HOFF AM CADOFF EM VILLANUEVA J PERSON NB

Citation: Am. Hoff et al., RESOLUTION OF SERUM-PROTEIN ELECTROPHORESIS RESULTS BY REMOVING RESIDUAL FIBRINOGEN WITH SUPERSERUM(R), Clinical chemistry, 41(6), 1995, pp. 203-203

Authors: OSTAPENKO S SAVCHUK AU NOWAK G LAGOWSKI J HOFF AM

Citation: S. Ostapenko et al., ENHANCEMENT OF ROOM-TEMPERATURE PHOTOLUMINESCENCE IN THIN-FILM POLYCRYSTALLINE SILICON PRODUCED BY LOW-POWER LASER ANNEALING, Applied physics letters, 67(20), 1995, pp. 2942-2944

Authors: KONTKIEWICZ AJ KONTKIEWICZ AM SIEJKA J SEN S NOWAK G HOFF AM SAKTHIVEL P AHMED K MUKHERJEE P WITANACHCHI S LAGOWSKI J

Citation: Aj. Kontkiewicz et al., EVIDENCE THAT BLUE LUMINESCENCE OF OXIDIZED POROUS SILICON ORIGINATESFROM SIO2, Applied physics letters, 65(11), 1994, pp. 1436-1438

Authors: LAGOWSKI J EDELMAN P KONTKIEWICZ AM MILIC O HENLEY W DEXTER M JASTRZEBSKI L HOFF AM

Citation: J. Lagowski et al., IRON DETECTION IN THE PART PER QUADRILLION RANGE IN SILICON USING SURFACE PHOTOVOLTAGE AND PHOTODISSOCIATION OF IRON-BORON PAIRS, Applied physics letters, 63(22), 1993, pp. 3043-3045