Authors: SALDITT T LOTT D METZGER TH PEISL J VIGNAUD G LEGRAND JF GRUBEL G HOGHOI P SCHARPF O

Citation: T. Salditt et al., CHARACTERIZATION OF INTERFACE ROUGHNESS IN W SI MULTILAYERS BY HIGH-RESOLUTION DIFFUSE-X-RAY SCATTERING/, Physica. B, Condensed matter, 221(1-4), 1996, pp. 13-17