Authors:
SALDITT T
LOTT D
METZGER TH
PEISL J
VIGNAUD G
LEGRAND JF
GRUBEL G
HOGHOI P
SCHARPF O
Citation: T. Salditt et al., CHARACTERIZATION OF INTERFACE ROUGHNESS IN W SI MULTILAYERS BY HIGH-RESOLUTION DIFFUSE-X-RAY SCATTERING/, Physica. B, Condensed matter, 221(1-4), 1996, pp. 13-17