Authors: HOMBOURGER C

Citation: C. Hombourger, AN EMPIRICAL EXPRESSION FOR K-SHELL IONIZATION CROSS-SECTION BY ELECTRON-IMPACT, Journal of physics. B, Atomic molecular and optical physics, 31(16), 1998, pp. 3693-3702

Authors: JONNARD P HOMBOURGER C VERGAND F BONNELLE C EALET B RENOU A GILLET E

Citation: P. Jonnard et al., COMPARISON OF CU-MGO INTERFACES STUDIED BY EXES AND XPS, Surface review and letters, 5(1), 1998, pp. 369-373

Authors: HOMBOURGER C JONNARD P BONNELLE C BEAUPREZ E SPIRCKEL M FELTZ B BOUTARD D GALLIEN JP

Citation: C. Hombourger et al., DEPTH PROFILES OF AL MN SI MULTILAYERS, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 287-300

Authors: JONNARD P HOMBOURGER C VERGAND F BONNELLE C RENOU A ASSABAN A GILLET E GILLET M

Citation: P. Jonnard et al., PHYSICOCHEMICAL INTERACTION AND ATOMIC-STRUCTURE AT CU-MGO INTERFACES, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 325-334

Authors: JONNARD P TIXIER C DESMAISON J HOMBOURGER C BONNELLE C

Citation: P. Jonnard et al., STUDY OF THE ADHESION BETWEEN A-CH FILMS AND TA6V SUBSTRATES BY ELECTRON-INDUCED X-RAY-EMISSION SPECTROSCOPY (EXES), Thin solid films, 306(1), 1997, pp. 119-123

Authors: JONNARD P CHARGELEGUE P HOMBOURGER C THIRION J VERGAND F

Citation: P. Jonnard et al., TEMPERATURE-DEPENDENT SAMPLE HOLDER FOR X-RAY SPECTROMETER, Review of scientific instruments, 67(6), 1996, pp. 2417-2418