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IDENTIFICATION POSSIBILITY OF METALLIC IMPURITIES IN P-TYPE SILICON BY LIFETIME MEASUREMENT
Authors:
HORANYI TS TUTTO P KOVACSICS C
Citation:
Ts. Horanyi et al., IDENTIFICATION POSSIBILITY OF METALLIC IMPURITIES IN P-TYPE SILICON BY LIFETIME MEASUREMENT, Journal of the Electrochemical Society, 143(1), 1996, pp. 216-220
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