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MINOR AND TRACE-ELEMENT ANALYSIS OF NATURAL ZIRCON (ZRSIO4) BY SIMS AND LASER-ABLATION ICPMS - A CONSIDERATION AND COMPARISON OF 2 BROADLY COMPETITIVE TECHNIQUES
Authors: HOSKIN PWO
Citation: Pwo. Hoskin, MINOR AND TRACE-ELEMENT ANALYSIS OF NATURAL ZIRCON (ZRSIO4) BY SIMS AND LASER-ABLATION ICPMS - A CONSIDERATION AND COMPARISON OF 2 BROADLY COMPETITIVE TECHNIQUES, Journal of trace and microprobe techniques, 16(3), 1998, pp. 301-326
IN-SITU ACCURATE AND PRECISE LEAD ISOTOPIC ANALYSIS OF ULTRA-SMALL ANALYTE VOLUMES (10-(16)M(3)) OF SOLID INORGANIC SAMPLES BY HIGH-MASS RESOLUTION SECONDARY-ION MASS-SPECTROMETRY
Authors: HOSKIN PWO WYSOCZANSKI RJ
Citation: Pwo. Hoskin et Rj. Wysoczanski, IN-SITU ACCURATE AND PRECISE LEAD ISOTOPIC ANALYSIS OF ULTRA-SMALL ANALYTE VOLUMES (10-(16)M(3)) OF SOLID INORGANIC SAMPLES BY HIGH-MASS RESOLUTION SECONDARY-ION MASS-SPECTROMETRY, Journal of analytical atomic spectrometry (Print), 13(7), 1998, pp. 597-601
RAMAN SPECTRAL SHIFT IN THE ISOMORPHOUS SERIES (ZR1-XHFX)SIO4
Authors: HOSKIN PWO RODGERS KA
Citation: Pwo. Hoskin et Ka. Rodgers, RAMAN SPECTRAL SHIFT IN THE ISOMORPHOUS SERIES (ZR1-XHFX)SIO4, European journal of solid state and inorganic chemistry, 33(11), 1996, pp. 1111-1121
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