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Results: 1-3 |
Results: 3
COMPLETE MUELLER MATRIX MEASUREMENT WITH A SINGLE HIGH-FREQUENCY MODULATION
Authors: COMPAIN E DREVILLON B HUC J PAREY JY BOUREE JE
Citation: E. Compain et al., COMPLETE MUELLER MATRIX MEASUREMENT WITH A SINGLE HIGH-FREQUENCY MODULATION, Thin solid films, 313, 1998, pp. 47-52
DUAL-PLASMA REACTOR FOR LOW-TEMPERATURE DEPOSITION OF WIDE BAND-GAP SILICON ALLOYS
Authors: ETEMADI R GODET C PERRIN J DREVILLON B HUC J PAREY JY ROSTAING JC COEURET F
Citation: R. Etemadi et al., DUAL-PLASMA REACTOR FOR LOW-TEMPERATURE DEPOSITION OF WIDE BAND-GAP SILICON ALLOYS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(2), 1997, pp. 320-331
SILICON-BASED, PROTECTIVE TRANSPARENT MULTILAYER COATINGS DEPOSITED AT HIGH-RATE ON OPTICAL POLYMERS BY DUAL-MODE MW RF PECVD/
Authors: ROSTAING JC COEURET F DREVILLON B ETEMADI R GODET C HUC J PAREY JY YAKOVLEV VA
Citation: Jc. Rostaing et al., SILICON-BASED, PROTECTIVE TRANSPARENT MULTILAYER COATINGS DEPOSITED AT HIGH-RATE ON OPTICAL POLYMERS BY DUAL-MODE MW RF PECVD/, Thin solid films, 236(1-2), 1993, pp. 58-63
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