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Results:
1-8
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Results: 8
Authors:
HUDNER J
HELLBERG PE
KUSCHE D
OHLSEN H
Citation: J. Hudner et al., TANTALUM OXIDE-FILMS ON SILICON GROWN BY TANTALUM EVAPORATION IN ATOMIC OXYGEN, Thin solid films, 282(1-2), 1996, pp. 415-418
Authors:
HUDNER J
OHLSEN H
FREDRIKSSON E
Citation: J. Hudner et al., GROWTH AND CHARACTERIZATION OF YTTRIUM-OXIDE THIN-LAYERS ON SILICON DEPOSITED BY YTTRIUM EVAPORATION IN ATOMIC OXYGEN, Vacuum, 46(8-10), 1995, pp. 967-970
Authors:
HUDNER J
THOMAS O
WEISS F
BOURSIER D
MOSSANG E
SENATEUR JP
VILLEGIER JC
MORICEAU H
SCHWERDTFEGER M
JAGER A
OHLSEN H
Citation: J. Hudner et al., MEASUREMENTS OF CRITICAL CURRENTS AS A FUNCTION OF TEMPERATURE IN YBA2CU3O7-X THIN-FILMS - A COMPARATIVE-STUDY, Superconductor science and technology, 7(4), 1994, pp. 195-205
Authors:
DOYLE JP
SVENSSON BG
ABOELFOTOH MO
HUDNER J
Citation: Jp. Doyle et al., AN INVESTIGATION OF THE STABILITY OF COPPER GERMANIDE THIN-FILMS IN THE PRESENCE OF SI AND SIO2, Physica scripta. T, 54, 1994, pp. 297-299
Authors:
HUDNER J
OHLSEN H
OSTLING M
STOLT L
NORLING P
Citation: J. Hudner et al., STUDIES OF YBA2CU3O(7-X) FORMATION IN COEVAPORATED Y-BAF2-CU-O THIN-FILMS ON SAPPHIRE SUBSTRATES, Thin solid films, 247(2), 1994, pp. 213-225
Authors:
THOMAS O
HUDNER J
OSTLING M
MOSSANG E
CHENEVIER B
WEISS F
BOURSIER D
SENATEUR JP
Citation: O. Thomas et al., GROWTH AND PROPERTIES OF MOCVD YBA2CU3O7-X THIN-FILMS, Journal of alloys and compounds, 195(1-2), 1993, pp. 287-290
Authors:
HUDNER J
THOMAS O
MOSSANG E
CHAUDOUET P
WEISS F
BOURSIER D
SENATEUR JP
OSTLING M
GASKOV A
Citation: J. Hudner et al., THIN-FILM GROWTH AND COMPOSITIONAL EFFECTS IN YBA2CU3O7-X LAYERS PREPARED BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Journal of applied physics, 74(7), 1993, pp. 4631-4642
Authors:
WEISS F
FICK J
HUDNER J
MOSSANG E
PHO PQ
THOMAS O
SENATEUR JP
Citation: F. Weiss et al., FUNDAMENTAL AND HARMONIC AC SUSCEPTIBILITY RESPONSE OF MOCVD YBA2CU3O7 THIN-FILMS - MODEL OF FLUX LINE BEHAVIOR, Cryogenics, 33(5), 1993, pp. 497-501
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