Authors: HUGHES TW DUMIN DJ

Citation: Tw. Hughes et Dj. Dumin, DETERMINATION OF THE RELATIVE DENSITIES OF HIGH-VOLTAGE STRESSED-GENERATED TRAPS NEAR THE ANODE AND CATHODE IN 10-NM-THICK SILICON-OXIDES, Journal of applied physics, 79(6), 1996, pp. 3089-3093

Authors: SCOTT RS DUMIN NA HUGHES TW DUMIN DJ MOORE BT

Citation: Rs. Scott et al., PROPERTIES OF HIGH-VOLTAGE STRESS GENERATED TRAPS IN THIN SILICON-OXIDE, I.E.E.E. transactions on electron devices, 43(7), 1996, pp. 1133-1143

Authors: DUMIN DJ MADDUX JR SUBRAMONIAM R SCOTT RS VANCHINATHAN S DUMIN NA DICKERSON KJ MOPURI S GLADSTONE SM HUGHES TW

Citation: Dj. Dumin et al., CHARACTERIZING WEAROUT, BREAKDOWN, AND TRAP GENERATION IN THIN SILICON-OXIDE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1780-1787