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Results:
1-8
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Results: 8
Authors:
Niemczyk, TM
Zhang, SB
Haaland, DM
Citation: Tm. Niemczyk et al., Monitoring dielectric thin-film production on product wafers using infrared emission spectroscopy, APPL SPECTR, 55(8), 2001, pp. 1053-1059
Authors:
Haaland, DM
Melgaard, DK
Citation: Dm. Haaland et Dk. Melgaard, New classical least-squares/partial least-squares hybrid algorithm for spectral analyses, APPL SPECTR, 55(1), 2001, pp. 1-8
Authors:
Haaland, DM
Chambers, WB
Keenan, MR
Melgaard, DK
Citation: Dm. Haaland et al., Multi-window classical least-squares multivariate calibration methods for quantitative ICP-AES analyses, APPL SPECTR, 54(9), 2000, pp. 1291-1302
Authors:
Haaland, DM
Melgaard, DK
Citation: Dm. Haaland et Dk. Melgaard, New prediction-augmented classical least-squares (PACLS) methods: Application to unmodeled interferents, APPL SPECTR, 54(9), 2000, pp. 1303-1312
Authors:
Haaland, DM
Citation: Dm. Haaland, Synthetic multivariate models to accommodate unmodeled interfering spectral components during quantitative spectral analyses, APPL SPECTR, 54(2), 2000, pp. 246-254
Authors:
Niemczyk, TM
Zhang, SB
Franke, JE
Haaland, DM
Citation: Tm. Niemczyk et al., Quantitative determination of borophosphosilicate glass thin-film properties using infrared emission spectroscopy, APPL SPECTR, 53(7), 1999, pp. 822-828
Authors:
Han, L
Niemczyk, TM
Haaland, DM
Lopez, GP
Citation: L. Han et al., Enhancing IR detection limits for trace polar organics in aqueous solutions with surface-modified sol-gel-coated ATR sensors, APPL SPECTR, 53(4), 1999, pp. 381-389
Authors:
Haaland, DM
Han, L
Niemczyk, TM
Citation: Dm. Haaland et al., Use of CLS to understand PLS IR calibration for trace detection of organicmolecules in water, APPL SPECTR, 53(4), 1999, pp. 390-395
Risultati:
1-8
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