Authors: Hodoroaba, VD Unger, WES Jenett, H Hoffmann, V Hagenhoff, B Kayser, S Wetzig, K

Citation: Vd. Hodoroaba et al., Depth profiling of electrically non-conductive layered samples by RF-GDOESand HFM plasma SNMS, APPL SURF S, 179(1-4), 2001, pp. 30-37

Authors: Tidwell, CD Castner, DG Golledge, SL Ratner, BD Meyer, K Hagenhoff, B Benninghoven, A

Citation: Cd. Tidwell et al., Static time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films, SURF INT AN, 31(8), 2001, pp. 724-733

Authors: Hagenhoff, B

Citation: B. Hagenhoff, High resolution surface analysis by TOF-SIMS, MIKROCH ACT, 132(2-4), 2000, pp. 259-271

Authors: Lo, YS Huefner, ND Chan, WS Dryden, P Hagenhoff, B Beebe, TP

Citation: Ys. Lo et al., Organic and inorganic contamination on commercial AFM cantilevers, LANGMUIR, 15(19), 1999, pp. 6522-6526