Authors: Schwartz, DT Haight, SM

Citation: Dt. Schwartz et Sm. Haight, Transport and chemistry at electroactive interfaces studied using line-imaging Raman spectroscopy, COLL SURF A, 174(1-2), 2000, pp. 209-219

Authors: Haight, SM Schwartz, DT Lilga, MA

Citation: Sm. Haight et al., In situ oxidation state profiling of nickel hexacyanoferrate derivatized electrodes using line-imaging Raman spectroscopy and multivariate calibration, J ELCHEM SO, 146(5), 1999, pp. 1866-1872