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Modeling and measuring the reflection and transmission of a silicon wafer in the X- and Ka-bands under illumination of light in a closed waveguide structure
Authors: Hajian, M Heijnen, SH Groen, F Hakkert, P Ligthart, LP
Citation: M. Hajian et al., Modeling and measuring the reflection and transmission of a silicon wafer in the X- and Ka-bands under illumination of light in a closed waveguide structure, MICROW OPT, 31(5), 2001, pp. 349-353
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