AAAAAA

   
Results: 1-7 |
Results: 7
Gate oxide integrity on ITOX-SIMOX substrates and influence of test devicegeometry on characterization
Authors: Kawamura, K Deai, H Sakamoto, H Yano, T Hamaguchi, I Takayama, S Nagatake, Y Tachimori, M Matsumura, A
Citation: K. Kawamura et al., Gate oxide integrity on ITOX-SIMOX substrates and influence of test devicegeometry on characterization, IEEE DEVICE, 48(2), 2001, pp. 307-315
Lentivirus gene transfer in murine hematopoietic progenitor cells is compromised by a delay in proviral integration and results in transduction mosaicism and heterogeneous gene expression in progeny cells
Authors: Mikkola, H Woods, NB Sjogren, M Helgadottir, H Hamaguchi, I Jacobsen, SE Trono, D Karlsson, S
Citation: H. Mikkola et al., Lentivirus gene transfer in murine hematopoietic progenitor cells is compromised by a delay in proviral integration and results in transduction mosaicism and heterogeneous gene expression in progeny cells, J VIROLOGY, 74(24), 2000, pp. 11911-11918
Lentivirus vector gene expression during ES cell-derived hematopoietic development in vitro
Authors: Hamaguchi, I Woods, NB Panagopoulos, I Andersson, E Mikkola, H Fahlman, C Zufferey, R Carlsson, L Trono, D Karlsson, S
Citation: I. Hamaguchi et al., Lentivirus vector gene expression during ES cell-derived hematopoietic development in vitro, J VIROLOGY, 74(22), 2000, pp. 10778-10784
Analysis of buried-oxide dielectric breakdown mechanism in low-dose separation by implanted oxygen (SIMOX) substrates fabricated by internal thermal oxidation (ITOX) process
Authors: Kawamura, K Yano, T Hamaguchi, I Takayama, S Nagatake, Y Matsumura, A
Citation: K. Kawamura et al., Analysis of buried-oxide dielectric breakdown mechanism in low-dose separation by implanted oxygen (SIMOX) substrates fabricated by internal thermal oxidation (ITOX) process, JPN J A P 1, 38(4B), 1999, pp. 2477-2482
Low-dose SIMOX wafers for LSIs fabricated with internal-thermal-oxidation (ITOX) process: electrical characterization
Authors: Matsumura, A Kawamura, K Hamaguchi, I Takayama, S Yano, T Nagatake, Y
Citation: A. Matsumura et al., Low-dose SIMOX wafers for LSIs fabricated with internal-thermal-oxidation (ITOX) process: electrical characterization, J MAT S-M E, 10(5-6), 1999, pp. 365-371
In vitro hematopoietic and endothelial cell development from cells expressing TEK receptor in murine aorta-gonad-mesonephros region
Authors: Hamaguchi, I Huang, XL Takakura, N Tada, J Yamaguchi, Y Kodama, H Suda, T
Citation: I. Hamaguchi et al., In vitro hematopoietic and endothelial cell development from cells expressing TEK receptor in murine aorta-gonad-mesonephros region, BLOOD, 93(5), 1999, pp. 1549-1556
Critical role of the TIE2 endothelial cell receptor in the development of definitive hematopoiesis
Authors: Takakura, N Huang, XL Naruse, T Hamaguchi, I Dumont, DJ Yancopoulos, GD Suda, T
Citation: N. Takakura et al., Critical role of the TIE2 endothelial cell receptor in the development of definitive hematopoiesis, IMMUNITY, 9(5), 1998, pp. 677-686
Risultati: 1-7 |