Citation: S. Hamma et Pri. Cabarrocas, Low-temperature growth of thick intrinsic and ultrathin phosphorous or boron-doped microcrystalline silicon films: Optimum crystalline fractions for solar cell applications, SOL EN MAT, 69(3), 2001, pp. 217-239
Authors:
Paillard, V
Puech, P
Sirvin, R
Hamma, S
Cabarrocas, PRI
Citation: V. Paillard et al., Measurement of the in-depth stress profile in hydrogenated microcrystalline silicon thin films using Raman spectrometry, J APPL PHYS, 90(7), 2001, pp. 3276-3279
Citation: S. Hamma et Pi. Roca I Cabarrocas, Determination of the mobility gap of microcrystalline silicon and of the band discontinuities at the amorphous microcrystalline silicon interface using in situ Kelvin probe technique, APPL PHYS L, 74(21), 1999, pp. 3218-3220