Authors: Kuscer, D Hanzel, D Holc, J Hrovat, M Kolar, D

Citation: D. Kuscer et al., Defect structure and electrical properties of La1-ySryFe1-xAlxO3-delta, J AM CERAM, 84(5), 2001, pp. 1148-1154

Authors: Marek, T Hanzel, D Szeles, C Suvegh, K Vertes, A Lynn, KG

Citation: T. Marek et al., The limits of application of variable-energy slow positron beams for investigating TiN hard coatings prepared by PVD, J RAD NUCL, 245(2), 2000, pp. 347-352

Authors: Worley, J Bechtol, K Penn, S Roach, D Hanzel, D Trounstine, M Barker, D

Citation: J. Worley et al., A systems approach to fabricating and analyzing DNA microarrays, MICROARRAY BIOCHIP TECHNOLOGY, 2000, pp. 65

Authors: Marco, JF Agudelo, AC Gancedo, JR Hanzel, D

Citation: Jf. Marco et al., Corrosion resistance of single TiN layers, Ti/TiN bilayers and Ti/TiN/Ti/TiN multilayers on iron under a salt fog spray (Phohesion) test: an evaluation by XPS, SURF INT AN, 27(2), 1999, pp. 71-75

Authors: Lakatos-Varsanyi, M Hanzel, D

Citation: M. Lakatos-varsanyi et D. Hanzel, Cyclic voltammetry measurements of different single-, bi- and multilayer TiN and single layer CrN coatings on low-carbon-steel substrates, CORROS SCI, 41(8), 1999, pp. 1585-1598