Authors:
Basnar, B
Golka, S
Gornik, E
Harasek, S
Bertagnolli, E
Schatzmayr, M
Smoliner, J
Citation: B. Basnar et al., Calibrated scanning capacitance microscopy investigations on p-doped Si multilayers, J VAC SCI B, 19(5), 2001, pp. 1808-1812
Citation: G. Fafilek et S. Harasek, Voltammetric measurements on MexOy (Me = Bi, Cu, V) compounds and comparison with results for BICUVOX.10, SOL ST ION, 119(1-4), 1999, pp. 91-96