Authors: Tekleab, D Poole, KF Singh, R Carroll, DL Harrell, WR

Citation: D. Tekleab et al., Modeling early failure in integrated circuit interconnect, MICROEL REL, 40(6), 2000, pp. 991-996

Authors: Harrell, WR Frey, J

Citation: Wr. Harrell et J. Frey, Observation of Poole-Frenkel effect saturation in SiO2 and other insulating films, THIN SOL FI, 352(1-2), 1999, pp. 195-204