Authors: Miyamoto, K Amemiya, N Banno, N Torii, M Hatasa, E Mizushima, E Nakagawa, T Mukai, H Ohmatsu, K

Citation: K. Miyamoto et al., Measurement and FEM analysis of magnetization loss in HTS tapes, IEEE APPL S, 9(2), 1999, pp. 770-773