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Authors: Jung, KB Cho, H Hahn, YB Hays, DC Lambers, ES Park, YD Feng, T Childress, JR Pearton, SJ
Citation: Kb. Jung et al., Comparison of Cl-2/He, Cl-2/Ar, and Cl-2/Xe plasma chemistries for dry etching of NiFe and NiFeCo, J ELCHEM SO, 146(4), 1999, pp. 1465-1468

Authors: Hays, DC Jung, KB Hahn, YB Lambers, ES Pearton, SJ Donahue, J Johnson, D Shul, RJ
Citation: Dc. Hays et al., Comparison of F-2-based gases for high-rate dry etching of Si, J ELCHEM SO, 146(10), 1999, pp. 3812-3816
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