Authors: Ma, ZH Merkus, HG de Smet, JGAE Heffels, C Scarlett, B

Citation: Zh. Ma et al., New developments in particle characterization by laser diffraction: size and shape, POWD TECH, 111(1-2), 2000, pp. 66-78

Authors: Anderlik, R Ettmuller, J Radle, M Hofmann, J Heffels, C

Citation: R. Anderlik et al., In-line colour measurement - Continuous colour measurement during the compounding of plastics, KUNSTST-P E, 89(8), 1999, pp. A90

Authors: Heffels, C Polke, R Radle, M Sachweh, B Schafer, M Scholz, N

Citation: C. Heffels et al., Control of particulate processes by optical measurement techniques, PART PART S, 15(5), 1998, pp. 211-218