Authors: Hefner, A Berning, D Blackburn, D Chapuy, C Bouche, S

Citation: A. Hefner et al., A high-speed thermal imaging system for semiconductor device analysis, P IEEE SEM, 2001, pp. 43-49

Authors: Havlik, E Pirich, C Preitfellner, J Karanikas, G Schaffarich, P Hefner, A Sinzinger, H

Citation: E. Havlik et al., Radiation exposure from patients treated with Dy-165-ferric hydroxide, NUCL MED C, 22(1), 2001, pp. 79-82

Authors: Lai, JS Song, BM Zhou, R Hefner, A Berning, DW Shen, CC

Citation: Js. Lai et al., Characteristics and utilization of a new class of low on-resistance MOS-gated power device, IEEE IND AP, 37(5), 2001, pp. 1282-1289