Citation: Kph. Lui et Fa. Hegmann, Ultrafast carrier relaxation in radiation-damaged silicon on sapphire studied by optical-pump-terahertz-probe experiments, APPL PHYS L, 78(22), 2001, pp. 3478-3480
Authors:
Hegmann, FA
Williams, JB
Cole, B
Sherwin, MS
Beeman, JW
Haller, EE
Citation: Fa. Hegmann et al., Time-resolved photoresponse of a gallium-doped germanium photoconductor using a variable pulse-width terahertz source, APPL PHYS L, 76(3), 2000, pp. 262-264