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Citation: M. Kuhn et al., Defect visualization in large area YBCO thin films by magneto-optical scanning technique, IEEE APPL S, 9(2), 1999, pp. 1844-1847

Authors: Gromoll, B Ries, G Schmidt, W Kraemer, HP Seebacher, B Utz, B Nies, R Neumueller, HW Baltzer, E Fischer, S Heismann, B

Citation: B. Gromoll et al., Resistive fault current limiters with YBCO films - 100 kVA functional model, IEEE APPL S, 9(2), 1999, pp. 656-659