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Results: 1
An evaluation of a commercial Echelle spectrometer with intensified charge-coupled device detector for materials analysis by laser-induced plasma spectroscopy
Authors:
Detalle, V Heon, R Sabsabi, M St-Onge, L
Citation:
V. Detalle et al., An evaluation of a commercial Echelle spectrometer with intensified charge-coupled device detector for materials analysis by laser-induced plasma spectroscopy, SPECT ACT B, 56(6), 2001, pp. 1011-1025
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