Authors:
Lu, RP
Kavanagh, KL
Dixon-Warren, SJ
Kuhl, A
Thorpe, AJS
Griswold, E
Hillier, G
Calder, I
Ares, R
Streater, R
Citation: Rp. Lu et al., Calibrated scanning spreading resistance microscopy profiling of carriers in III-V structures, J VAC SCI B, 19(4), 2001, pp. 1662-1670