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Results: 26-33/33
Authors:
Farley, NRS
Gurman, SJ
Hillman, AR
Citation: Nrs. Farley et al., In situ EXAFS study of nickel hydroxide electrodes during discharge, J SYNCHROTR, 6, 1999, pp. 198-200
Authors:
Wilson, RW
Cubitt, R
Glidle, A
Hillman, AR
Saville, PM
Vos, JG
Citation: Rw. Wilson et al., A neutron reflectivity study of [Os(bipy)(2)(PVP)(10)Cl](+) polymer film modified electrodes: effect of redox state and counter ion, ELECTR ACT, 44(20), 1999, pp. 3533-3548
Authors:
Presa, MJR
Bandey, HL
Tucceri, RI
Florit, MI
Posadas, D
Hillman, AR
Citation: Mjr. Presa et al., Film thickness and electrolyte concentration effects on the EIS response of Poly-(o-toluidine) in the conducting state, ELECTR ACT, 44(12), 1999, pp. 2073-2085
Authors:
Bandey, HL
Martin, SJ
Cernosek, RW
Hillman, AR
Citation: Hl. Bandey et al., Modeling the responses of thickness-shear mode resonators under various loading conditions, ANALYT CHEM, 71(11), 1999, pp. 2205-2214
Authors:
Henderson, MJ
Hillman, AR
Vieil, E
Lopez, C
Citation: Mj. Henderson et al., Combined electrochemical quartz crystal microbalance (EQCM) and probe beamdeflection (PBD): validation of the technique by a study of silver ion mass transport, J ELEC CHEM, 458(1-2), 1998, pp. 241-248
Authors:
Bruckenstein, S
Hillman, AR
Citation: S. Bruckenstein et Ar. Hillman, Hyphenated techniques in dynamic electrochemistry. 1. Mechanistic diagnosis for redox switching of electroactive films using nonelectrochemical population probes, J PHYS CH B, 102(52), 1998, pp. 10826-10835
Authors:
Hillman, AR
Saville, PM
Glidle, A
Richardson, RM
Roser, SJ
Swann, MJ
Webster, JRP
Citation: Ar. Hillman et al., Neutron reflectivity determination of buried electroactive interface structure: PBT/PPy and PBT/PXV bilayers, J AM CHEM S, 120(49), 1998, pp. 12882-12890
Authors:
Hillman, AR
Brown, MJ
Martin, SJ
Citation: Ar. Hillman et al., Resonance effects in electroactive poly(3-hexylthiophene) films, J AM CHEM S, 120(49), 1998, pp. 12968-12969