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Results:
1-12
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Results: 12
Authors:
Brady, MP
Hoelzer, DT
Payzant, EA
Tortorelli, PF
Horton, JA
Anderson, IM
Walker, LR
Wrobel, SK
Citation: Mp. Brady et al., Templated growth of a complex nitride island dispersion through an internal nitridation reaction, J MATER RES, 16(10), 2001, pp. 2784-2787
Authors:
Hoelzer, DT
Pint, BA
Wright, IG
Citation: Dt. Hoelzer et al., A microstructural study of the oxide scale formation on ODS Fe-13Cr steel, J NUCL MAT, 283, 2000, pp. 1306-1310
Authors:
Grossbeck, ML
King, JF
Hoelzer, DT
Citation: Ml. Grossbeck et al., Impurity effects on gas tungsten arc welds in V-Cr-Ti alloys, J NUCL MAT, 283, 2000, pp. 1356-1360
Authors:
Miwa, Y
Sawai, T
Fukai, K
Hoelzer, DT
Hishinuma, A
Citation: Y. Miwa et al., Microstructures in Ti-Al intermetallic compounds irradiated at 673 K in HFIR, J NUCL MAT, 283, 2000, pp. 273-277
Authors:
Rowcliffe, AF
Zinkle, SJ
Hoelzer, DT
Citation: Af. Rowcliffe et al., Effect of strain rate on the tensile properties of unirradiated and irradiated V-4Cr-4Ti, J NUCL MAT, 283, 2000, pp. 508-512
Authors:
Hoelzer, DT
West, MK
Zinkle, SJ
Rowcliffe, AF
Citation: Dt. Hoelzer et al., Solute interactions in pure vanadium and V-4Cr-4Ti alloy, J NUCL MAT, 283, 2000, pp. 616-621
Authors:
Romanoski, GR
Snead, LL
Klueh, RL
Hoelzer, DT
Citation: Gr. Romanoski et al., Development of an oxide dispersion strengthened, reduced-activation steel for fusion energy, J NUCL MAT, 283, 2000, pp. 642-646
Authors:
Jillavenkatesa, A
Hoelzer, DT
Condrate, RA
Citation: A. Jillavenkatesa et al., An electron microscopy study of the formation of hydroxyapatite through sol-gel processing, J MATER SCI, 34(19), 1999, pp. 4821-4830
Grain boundaries and growth kinetics of polycrystalline ferrimagnetic oxides with chemical additives
Authors:
Cho, YS
Hoelzer, DT
Burdick, VL
Amarakoon, VRW
Citation: Ys. Cho et al., Grain boundaries and growth kinetics of polycrystalline ferrimagnetic oxides with chemical additives, J APPL PHYS, 85(8), 1999, pp. 5220-5222
Authors:
Cho, YS
Hoelzer, DT
Schulze, WA
Amarakoon, VRW
Citation: Ys. Cho et al., Cordierite-based dielectric thick films on an oxidized copper layer: Microstructural evidence of copper diffusion, J AM CERAM, 82(7), 1999, pp. 1949-1952
Authors:
Cho, YS
Hoelzer, DT
Schulze, WA
Amarakoon, VRW
Citation: Ys. Cho et al., Crystallization and microstructural evolution of cordierite-based thick film dielectrics, ACT MATER, 46(18), 1998, pp. 6421-6430
Authors:
Park, E
Condrate, RA
Hoelzer, DT
Fischman, GS
Citation: E. Park et al., Interfacial characterization of plasma-spray coated calcium phosphate on Ti-6Al-4V, J MAT S-M M, 9(11), 1998, pp. 643-649
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