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Results:
1-7
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Results: 7
Authors:
Klose, F
Rehm, C
Fieber-Erdmann, M
Holub-Krappe, E
Bleif, HJ
Sowers, H
Goyette, R
Troger, L
Maletta, H
Citation: F. Klose et al., Hydrogen absorption in epitaxial W/Nb(001) and polycrystalline Fe/Nb(110) multilayers studied in situ by X-ray/neutron scattering techniques and X-ray absorption spectroscopy, PHYSICA B, 283(1-3), 2000, pp. 184-188
Authors:
Alonso-Vante, N
Borthen, P
Fieber-Erdmann, M
Strehblow, HH
Holub-Krappe, E
Citation: N. Alonso-vante et al., An in situ grazing incidence X-ray absorption study of ultra thin RuxSey cluster-like electrocatalyst layers, ELECTR ACT, 45(25-26), 2000, pp. 4227-4236
Authors:
Fieber-Erdmann, M
Rossner, H
Holub-Krappe, E
Eyert, V
Luck, I
Scheer, R
Citation: M. Fieber-erdmann et al., Structural properties of Zn2-2x(CuIn)(x)S-2 (x <= 1) solid solution thin film obtained by EXAFS, J SYNCHROTR, 6, 1999, pp. 474-476
Authors:
Katsikini, M
Fieber-Erdmann, M
Holub-Krappe, E
Korakakis, D
Moustakas, TD
Paloura, EC
Citation: M. Katsikini et al., Nitrogen K-edge NEXAFS measurements on group-III binary and ternary nitrides, J SYNCHROTR, 6, 1999, pp. 558-560
Authors:
Katsikini, M
Rossner, H
Fieber-Erdmann, M
Holub-Krappe, E
Moustakas, TD
Paloura, EC
Citation: M. Katsikini et al., Gallium K-edge EXAFS measurements on cubic and hexagonal GaN, J SYNCHROTR, 6, 1999, pp. 561-563
Authors:
Katsikini, M
Paloura, EC
Bollmann, J
Holub-Krappe, E
Masselink, WT
Citation: M. Katsikini et al., Nitrogen K-edge X-ray absorption measurements on N- and O-implanted GaN, J ELEC SPEC, 103, 1999, pp. 689-694
Authors:
Katsikini, M
Paloura, EC
Fieber-Erdmam, M
Holub-Krappe, E
Korakakis, D
Moustakas, TD
Citation: M. Katsikini et al., Nitrogen K-edge NEXAFS measurements on group-III binary and ternary nitrides, J ELEC SPEC, 103, 1999, pp. 695-699
Risultati:
1-7
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