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Results: 1-14 |
Results: 14
Age-related changes in the mitochondrial depolarization induced by oxidative injury in human peripheral blood leukocytes
Authors: Tsai, K Hsu, TG Lu, FJ Hsu, CF Liu, TY Kong, CW
Citation: K. Tsai et al., Age-related changes in the mitochondrial depolarization induced by oxidative injury in human peripheral blood leukocytes, FREE RAD RE, 35(4), 2001, pp. 395-403
Oxidative DNA damage in human peripheral leukocytes induced by massive aerobic exercise
Authors: Tsai, K Hsu, TG Hsu, KM Cheng, H Liu, TY Hsu, CF Kong, CW
Citation: K. Tsai et al., Oxidative DNA damage in human peripheral leukocytes induced by massive aerobic exercise, FREE RAD B, 31(11), 2001, pp. 1465-1472
Effect of composition and microstructure on temperature coefficient of resistance of polycrystalline La1-xCaxMnO3 thin films
Authors: Lai, CH Hsu, CF Chin, YC Chiang, CD
Citation: Ch. Lai et al., Effect of composition and microstructure on temperature coefficient of resistance of polycrystalline La1-xCaxMnO3 thin films, J VAC SCI A, 19(4), 2001, pp. 1186-1190
Denver Unit infill drilling an pattern reconfiguration
Authors: Thai, BN Hsu, CF Bergersen, BM Albrecht, SL Richardson, TW
Citation: Bn. Thai et al., Denver Unit infill drilling an pattern reconfiguration, J PETRO TEC, 53(1), 2001, pp. 53-54
Intersubband quantum-box semiconductor lasers
Authors: Hsu, CF O, JS Zory, P Botez, D
Citation: Cf. Hsu et al., Intersubband quantum-box semiconductor lasers, IEEE S T QU, 6(3), 2000, pp. 491-503
Spectroscopic investigations of plasma damage of kapton
Authors: Lee, S Tien, YC Hsu, CF
Citation: S. Lee et al., Spectroscopic investigations of plasma damage of kapton, J VAC SCI B, 18(2), 2000, pp. 805-810
Study of the impact of the time-delay effect on the critical dimension of a tungsten silicide/polysilicon gate after reactive ion etching
Authors: Lin, SP Ou, CH Lee, S Tien, YC Hsu, CF
Citation: Sp. Lin et al., Study of the impact of the time-delay effect on the critical dimension of a tungsten silicide/polysilicon gate after reactive ion etching, J VAC SCI A, 18(4), 2000, pp. 1173-1175
Untitled - Reply
Authors: Hsu, CF
Citation: Cf. Hsu, Untitled - Reply, EUR J PED, 159(1-2), 2000, pp. 126-127
The irrelevant values problem in the ID3 tree
Authors: Chiang, DA Chen, W Wang, YF Hsu, CF
Citation: Da. Chiang et al., The irrelevant values problem in the ID3 tree, COMPUT A IN, 19(2), 2000, pp. 169-182
Cholesterol monohydrate dissolution in bile salt-lecithin solutions
Authors: Liu, CL Hsu, CF
Citation: Cl. Liu et Cf. Hsu, Cholesterol monohydrate dissolution in bile salt-lecithin solutions, J CHIN CHEM, 47(3), 2000, pp. 461-467
The effectiveness of single and multiple applications of triple dye on umbilical cord separation time
Authors: Hsu, CF Wang, CC Yuh, YS Chen, YH Chu, ML
Citation: Cf. Hsu et al., The effectiveness of single and multiple applications of triple dye on umbilical cord separation time, EUR J PED, 158(2), 1999, pp. 144-146
Direct spectroscopic evidence of the influence of chamber wall condition on oxide etch rate
Authors: Lee, S Tien, YC Hsu, CF
Citation: S. Lee et al., Direct spectroscopic evidence of the influence of chamber wall condition on oxide etch rate, PLASMA CHEM, 19(2), 1999, pp. 285-298
Differential recruitment of annelids onto tidal elevations in an estuarinemud flat
Authors: Hsieh, HL Hsu, CF
Citation: Hl. Hsieh et Cf. Hsu, Differential recruitment of annelids onto tidal elevations in an estuarinemud flat, MAR ECOL-PR, 177, 1999, pp. 93-102
A comprehensive study of hot carrier stress-induced drain leakage current degradation in thin-oxide n-MOSFET's
Authors: Wang, TH Chiang, LP Zous, NK Hsu, CF Huang, LY Chao, TS
Citation: Th. Wang et al., A comprehensive study of hot carrier stress-induced drain leakage current degradation in thin-oxide n-MOSFET's, IEEE DEVICE, 46(9), 1999, pp. 1877-1882
Risultati: 1-14 |