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Results:
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Results: 1
Ka-band InP high electron mobility transistor monolithic microwave integrated circuit reliability
Authors:
Paine, BM Wong, RC Schmitz, AE Walden, RH Nguyen, LD Delaney, MJ Hum, KC
Citation:
Bm. Paine et al., Ka-band InP high electron mobility transistor monolithic microwave integrated circuit reliability, MICROEL REL, 41(8), 2001, pp. 1115-1122
Risultati:
1-1
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