Authors:
Hurtado-Ramos, JB
Blanco-Garcia, J
Fernandez, A
Ribas, F
Citation: Jb. Hurtado-ramos et al., An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations, MEAS SCI T, 12(5), 2001, pp. 644-651
Authors:
Hurtado-Ramos, JB
Stavroudis, ON
Wang, HM
Gomez-Rosas, G
Citation: Jb. Hurtado-ramos et al., Scattering loss measurements of evaporated slab waveguides of SiO2 and NdF3 using a prism coupler and angle-limited integrated scattering, OPT ENG, 39(2), 2000, pp. 558-564