Authors: Chaudhuri, J Ignatiev, K Edgar, JH Xie, ZY Gao, Y Rek, Z

Citation: J. Chaudhuri et al., Low temperature chemical vapor deposition of 3C-SiC on 6H-SiC - high resolution X-ray diffractometry and synchrotron X-ray topography study, MAT SCI E B, 76(3), 2000, pp. 217-224