Authors: Lenaerts, J Verlinden, G Ignatova, VA Van Vaeck, L Gijbels, R Geuens, I

Citation: J. Lenaerts et al., Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS), FRESEN J AN, 370(5), 2001, pp. 654-662