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Results:
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Results: 2
The noise power ratio - Theory and ADC testing
Authors:
Irons, FH Riley, KJ Hummels, DM Friel, GA
Citation:
Fh. Irons et al., The noise power ratio - Theory and ADC testing, IEEE INSTR, 49(3), 2000, pp. 659-665
Using sine wave histograms to estimate analog-to-digital converter dynamicerror functions
Authors:
Larrabee, J Irons, FH Hummels, DM
Citation:
J. Larrabee et al., Using sine wave histograms to estimate analog-to-digital converter dynamicerror functions, IEEE INSTR, 47(6), 1998, pp. 1448-1456
Risultati:
1-2
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