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Citation: T. Itoga et al., New technique to determine gettering efficiency of heavy metals and its application to carbon-ion-implanted Si epitaxial wafers, JPN J A P 1, 40(4A), 2001, pp. 2105-2109

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Citation: E. Iguchi et al., Thermoelectric properties in Bi2-xPbxSr3-yYyCo2O9-delta ceramics, J PHYS D, 34(6), 2001, pp. 1017-1024