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Results: 1-25/58
Authors:
ZOMMER L
LESIAK B
JABLONSKI A
GERGELY G
MENYHARD M
SULYOK A
GURBAN S
Citation: L. Zommer et al., DETERMINATION OF THE INELASTIC MEAN FREE-PATH OF ELECTRONS IN GAAS AND INP AFTER SURFACE CLEANING BY ION-BOMBARDMENT USING ELASTIC PEAK ELECTRON-SPECTROSCOPY, Journal of electron spectroscopy and related phenomena, 87(3), 1998, pp. 177-185
Authors:
JABLONSKI A
TOUGAARD S
Citation: A. Jablonski et S. Tougaard, EVALUATION OF VALIDITY OF THE DEPTH-DEPENDENT CORRECTION FORMULA (CF)FOR ELASTIC ELECTRON-SCATTERING EFFECTS IN AES AND XPS, Surface and interface analysis, 26(5), 1998, pp. 374-384
Authors:
LESIAK B
JABLONSKI A
ZEMEK J
JIRICEK P
Citation: B. Lesiak et al., DETERMINATION OF THE INELASTIC MEAN FREE PATHS OF ELECTRONS IN COPPERAND COPPER OXIDES BY ELASTIC PEAK ELECTRON-SPECTROSCOPY (EPES), Surface and interface analysis, 26(5), 1998, pp. 400-411
Authors:
ZEMEK J
HUCEK S
JABLONSKI A
TILININ IS
Citation: J. Zemek et al., ESCAPE PROBABILITY OF S-PHOTOELECTRONS LEAVING ALUMINUM AND COPPER OXIDES, Surface and interface analysis, 26(3), 1998, pp. 182-187
Authors:
JABLONSKI A
TOUGAARD S
Citation: A. Jablonski et S. Tougaard, PRACTICAL CORRECTION FORMULA FOR ELASTIC ELECTRON-SCATTERING EFFECTS IN ATTENUATION OF AUGER ELECTRONS AND PHOTOELECTRONS, Surface and interface analysis, 26(1), 1998, pp. 17-29
Authors:
JABLONSKI A
JIRICEK P
Citation: A. Jablonski et P. Jiricek, DEPENDENCE OF EXPERIMENTALLY DETERMINED INELASTIC MEAN FREE PATHS OF ELECTRONS ON THE MEASUREMENT GEOMETRY, Surface science, 413, 1998, pp. 42-54
Authors:
KRAWCZYK M
JABLONSKI A
TOUGAARD S
TOTH J
VARGA D
GERGELY G
Citation: M. Krawczyk et al., THE INELASTIC MEAN FREE-PATH AND THE INELASTIC-SCATTERING CROSS-SECTION OF ELECTRONS IN GAAS DETERMINED FROM HIGHLY RESOLVED ELECTRON-ENERGY SPECTRA, Surface science, 404(1-3), 1998, pp. 491-495
Authors:
JABLONSKI A
POWELL CJ
Citation: A. Jablonski et Cj. Powell, EVALUATION OF CORRECTION PARAMETERS FOR ELASTIC-SCATTERING EFFECTS INX-RAY PHOTOELECTRON-SPECTROSCOPY AND AUGER-ELECTRON SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(4), 1997, pp. 2095-2106
Authors:
TILININ IS
JABLONSKI A
ZEMEK J
HUCEK S
Citation: Is. Tilinin et al., ESCAPE PROBABILITY OF SIGNAL PHOTOELECTRONS FROM NONCRYSTALLINE SOLIDS - INFLUENCE OF ANISOTROPY OF PHOTOEMISSION, Journal of electron spectroscopy and related phenomena, 87(2), 1997, pp. 127-140
Authors:
HUCEK S
ZEMEK J
JABLONSKI A
Citation: S. Hucek et al., ESCAPE PROBABILITY OF O IS PHOTOELECTRONS LEAVING COPPER-OXIDE, Journal of electron spectroscopy and related phenomena, 85(3), 1997, pp. 257-262
Authors:
JABLONSKI A
TOUGAARD S
Citation: A. Jablonski et S. Tougaard, THE EXCITATION DEPTH DISTRIBUTION FUNCTION FOR AUGER ELECTRONS CREATED BY ELECTRON-IMPACT, Surface and interface analysis, 25(9), 1997, pp. 688-698
QUANTITATIVE XPS - INFLUENCE OF ELASTIC ELECTRON-SCATTERING IN QUANTIFICATION BY PEAK SHAPE-ANALYSIS
Authors:
TOUGAARD S
JABLONSKI A
Citation: S. Tougaard et A. Jablonski, QUANTITATIVE XPS - INFLUENCE OF ELASTIC ELECTRON-SCATTERING IN QUANTIFICATION BY PEAK SHAPE-ANALYSIS, Surface and interface analysis, 25(6), 1997, pp. 404-408
Authors:
KRAWCZYK M
ZOMMER L
LESIAK B
JABLONSKI A
Citation: M. Krawczyk et al., SURFACE-COMPOSITION OF THE COPD ALLOYS STUDIED BY ELECTRON SPECTROSCOPIES, Surface and interface analysis, 25(5), 1997, pp. 356-365
Authors:
TILININ IS
JABLONSKI A
TOUGAARD S
Citation: Is. Tilinin et al., EMISSION-DEPTH DEPENDENCE OF THE SIGNAL PHOTOELECTRON ENERGY-SPECTRUM, Surface and interface analysis, 25(2), 1997, pp. 119-131
Authors:
GERGELY G
KONKOL A
MENYHARD M
LESIAK B
JABLONSKI A
VARGA D
TOTH J
Citation: G. Gergely et al., DETERMINATION OF THE INELASTIC MEAN FREE-PATH (IMFP) OF ELECTRONS IN GERMANIUM AND SILICON BY ELASTIC PEAK ELECTRON-SPECTROSCOPY (EPES) USING AN ANALYZER OF HIGH-RESOLUTION, Vacuum, 48(7-9), 1997, pp. 621-624
Authors:
JABLONSKI A
ZEMEK J
Citation: A. Jablonski et J. Zemek, EXPERIMENTAL AND THEORETICAL TESTS OF ELASTIC-SCATTERING EFFECTS IN XPS, Surface science, 387(1-3), 1997, pp. 288-299
Authors:
TILININ IS
JABLONSKI A
LESIAKORLOWSKA B
Citation: Is. Tilinin et al., THE INFLUENCE OF ELASTIC-SCATTERING ON THE CONCENTRATION-DEPENDENCE OF THE PHOTOELECTRON LINE INTENSITY, Applied surface science, 101, 1996, pp. 20-24
Authors:
JABLONSKI A
TILININ IS
POWELL CJ
Citation: A. Jablonski et al., MEAN ESCAPE DEPTH OF SIGNAL PHOTOELECTRONS FROM AMORPHOUS AND POLYCRYSTALLINE SOLIDS, Physical review. B, Condensed matter, 54(15), 1996, pp. 10927-10937
Authors:
JABLONSKI A
JIRICEK P
Citation: A. Jablonski et P. Jiricek, ELASTIC ELECTRON BACKSCATTERING FROM SURFACES AT LOW ENERGIES, Surface and interface analysis, 24(11), 1996, pp. 781-785
Authors:
TILININ IS
JABLONSKI A
WERNER WSM
Citation: Is. Tilinin et al., QUANTITATIVE SURFACE-ANALYSIS BY AUGER AND X-RAY PHOTOELECTRON-SPECTROSCOPY, Progress in Surface Science, 52(4), 1996, pp. 193-335
Authors:
BROWN T
DRONSFIELD A
JABLONSKI A
WILKINSON AS
Citation: T. Brown et al., THE THERMOLYSIS OF BENZYL COBALOXIMES - A NEW ONE-STEP SYNTHESIS OF 5-ARYLISOXAZOLES, Tetrahedron letters, 37(30), 1996, pp. 5413-5416
Authors:
JABLONSKI A
Citation: A. Jablonski, UNIVERSAL QUANTIFICATION OF ELASTIC-SCATTERING EFFECTS IN AES AND XPS, Surface science, 364(3), 1996, pp. 380-395
Authors:
JABLONSKI A
ZEMEK J
Citation: A. Jablonski et J. Zemek, MAXIMUM PROBABILITY OF ELASTIC ELECTRON BACKSCATTERING FROM SURFACES OF AMORPHOUS AND POLYCRYSTALLINE SOLIDS, Surface science, 347(1-2), 1996, pp. 207-214
Authors:
ZEMEK J
HUCEK S
JABLONSKI A
TILININ IS
Citation: J. Zemek et al., PHOTOELECTRON ESCAPE DEPTH, Journal of electron spectroscopy and related phenomena, 76, 1995, pp. 443-447
Authors:
JABLONSKI A
TILININ IS
Citation: A. Jablonski et Is. Tilinin, TOWARDS A UNIVERSAL DESCRIPTION OF ELASTIC-SCATTERING EFFECTS IN X-RAY PHOTOELECTRON-SPECTROSCOPY, Journal of electron spectroscopy and related phenomena, 74(3), 1995, pp. 207-229