Authors: BATISTA JA MANSANARES AM DASILVA EC PIMENTEL MBC JANNUZZI N FOURNIER D

Citation: Ja. Batista et al., SUBSURFACE MICROSCOPY OF BIASED METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT-TRANSISTOR STRUCTURES - PHOTOTHERMAL AND ELECTROREFLECTANCE IMAGES, Sensors and actuators. A, Physical, 71(1-2), 1998, pp. 40-45