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Results: 1-9 |
Results: 9
ENHANCED HYDROGENATION IN POLYCRYSTALLINE SILICON THIN-FILMS USING LOW-TEMPERATURE ULTRASOUND TREATMENT
Authors: OSTAPENKO S JASTRZEBSKI L LAGOWSKI J SMELTZER RK
Citation: S. Ostapenko et al., ENHANCED HYDROGENATION IN POLYCRYSTALLINE SILICON THIN-FILMS USING LOW-TEMPERATURE ULTRASOUND TREATMENT, Applied physics letters, 68(20), 1996, pp. 2873-2875
CHANGE OF MINORITY-CARRIER DIFFUSION LENGTH IN POLYCRYSTALLINE SILICON BY ULTRASOUND TREATMENT
Authors: OSTAPENKO S JASTRZEBSKI L SOPORI B
Citation: S. Ostapenko et al., CHANGE OF MINORITY-CARRIER DIFFUSION LENGTH IN POLYCRYSTALLINE SILICON BY ULTRASOUND TREATMENT, Semiconductor science and technology, 10(11), 1995, pp. 1494-1500
EFFECTS OF IRON CONTAMINATION IN SILICON ON THIN OXIDE BREAKDOWN AND RELIABILITY CHARACTERISTICS
Authors: HENLEY WB JASTRZEBSKI L HADDAD NF
Citation: Wb. Henley et al., EFFECTS OF IRON CONTAMINATION IN SILICON ON THIN OXIDE BREAKDOWN AND RELIABILITY CHARACTERISTICS, Journal of non-crystalline solids, 187, 1995, pp. 134-139
IMPROVEMENT OF DIFFUSION LENGTH IN POLYCRYSTALLINE PHOTOVOLTAIC SILICON BY PHOSPHORUS AND CHLORINE GETTERING
Authors: JASTRZEBSKI L HENLEY W SCHIELEIN D LAGOWSKI J
Citation: L. Jastrzebski et al., IMPROVEMENT OF DIFFUSION LENGTH IN POLYCRYSTALLINE PHOTOVOLTAIC SILICON BY PHOSPHORUS AND CHLORINE GETTERING, Journal of the Electrochemical Society, 142(11), 1995, pp. 3869-3872
BAND-TAIL PHOTOLUMINESCENCE IN POLYCRYSTALLINE SILICON THIN-FILMS
Authors: SAVCHOUK AU OSTAPENKO S NOWAK G LAGOWSKI J JASTRZEBSKI L
Citation: Au. Savchouk et al., BAND-TAIL PHOTOLUMINESCENCE IN POLYCRYSTALLINE SILICON THIN-FILMS, Applied physics letters, 67(1), 1995, pp. 82-84
INCREASING SHORT MINORITY-CARRIER DIFFUSION LENGTHS IN SOLAR-GRADE POLYCRYSTALLINE SILICON BY ULTRASOUND TREATMENT
Authors: OSTAPENKO SS JASTRZEBSKI L LAGOWSKI J SOPORI B
Citation: Ss. Ostapenko et al., INCREASING SHORT MINORITY-CARRIER DIFFUSION LENGTHS IN SOLAR-GRADE POLYCRYSTALLINE SILICON BY ULTRASOUND TREATMENT, Applied physics letters, 65(12), 1994, pp. 1555-1557
MONITORING OF HEAVY-METAL CONTAMINATION DURING CHEMICAL CLEANING WITHSURFACE PHOTOVOLTAGE
Authors: JASTRZEBSKI L MILIC O DEXTER M LAGOWSKI J DEBUSK D NAUKA K WITOWSKI R GORDON M PERSSON E
Citation: L. Jastrzebski et al., MONITORING OF HEAVY-METAL CONTAMINATION DURING CHEMICAL CLEANING WITHSURFACE PHOTOVOLTAGE, Journal of the Electrochemical Society, 140(4), 1993, pp. 1152-1159
IRON DETECTION IN THE PART PER QUADRILLION RANGE IN SILICON USING SURFACE PHOTOVOLTAGE AND PHOTODISSOCIATION OF IRON-BORON PAIRS
Authors: LAGOWSKI J EDELMAN P KONTKIEWICZ AM MILIC O HENLEY W DEXTER M JASTRZEBSKI L HOFF AM
Citation: J. Lagowski et al., IRON DETECTION IN THE PART PER QUADRILLION RANGE IN SILICON USING SURFACE PHOTOVOLTAGE AND PHOTODISSOCIATION OF IRON-BORON PAIRS, Applied physics letters, 63(22), 1993, pp. 3043-3045
METHOD FOR THE MEASUREMENT OF LONG MINORITY-CARRIER DIFFUSION LENGTHSEXCEEDING WAFER THICKNESS
Authors: LAGOWSKI J KONTKIEWICZ AM JASTRZEBSKI L EDELMAN P
Citation: J. Lagowski et al., METHOD FOR THE MEASUREMENT OF LONG MINORITY-CARRIER DIFFUSION LENGTHSEXCEEDING WAFER THICKNESS, Applied physics letters, 63(21), 1993, pp. 2902-2904
Risultati: 1-9 |