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Results: 1
ON THE DECAY OF THE TRAPPED HOLES AND THE SLOW STATES IN METAL-OXIDE-SEMICONDUCTOR CAPACITORS
Authors:
MEINERTZHAGEN A PETIT C YARD G JAURDAIN M SALACE G
Citation:
A. Meinertzhagen et al., ON THE DECAY OF THE TRAPPED HOLES AND THE SLOW STATES IN METAL-OXIDE-SEMICONDUCTOR CAPACITORS, Journal of applied physics, 79(5), 1996, pp. 2549-2558
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